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Best Paper Award for Amirouche OUMAZIZ

par Laurence Laffont - publié le

PNG - 48.7 koAmirouche OUMAZIZ, PhD student at the end of his 3rd year attached to the CS-Laplace and ISGE-Laas groups, connected to both laboratories’ platforms, was awarded a BEST PAPER AWARD at the closing ceremony of the 32nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, held from October 4th to 7th, 2021, organized by ESREF 2021 conference - Elsevier Microelectronics Reliability journal, following the presentation in an oral session of part of his dissertation work dealing with :
"Fast cut-off, low I²T and high temperature monolithic on-chip fuse on silicon substrate for new fail-safe embedded power switch"
Auteurs : A. Oumaziz, E. Sarraute, F. Richardeau, A. Bourennane, C. Combettes, V. Bley, V. Bley, C. Combettes, A. Ghannam.

This same dissertation work will be presented as "Invited Paper" for one of the following international conferences : IRPS, IPFA or ISTFA 2022.